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Results of search for 'su:"Electronic-testing-Congresses"'
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Institute of Electri...
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Test conference : testing for the 80s : digest of papers, conference, 11th, Philadelphia, Nov. 11-13, 1980
by
Institute of Electrical and Electronics Engineers
|
.
Series:
Edition:
Language:
English
Publication details:
New York
;
IEEE,
;
1980
Availability:
Items available for loan:
1
Call number:
621.372:621.382 Ins:80
.
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International test conference : testing in the 1980s : digest of papers, Philadelphia, Oct. 27-29, 1981
by
Institute of Electrical and Electronics Engineers
|
.
Series:
Edition:
Language:
English
Publication details:
New York
;
IEEE,
;
1981
Availability:
Items available for loan:
1
Call number:
621.372:621.382 Ins:81
.
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International test conference : quality productivity profit : digest of papers, Philadelphia, Nov. 15-18, 1982
by
Institute of Electrical and Electronics Engineers
|
.
Series:
Edition:
Language:
English
Publication details:
New York
;
IEEE,
;
1982
Availability:
Items available for loan:
1
Call number:
621.372:621.382 Ins:82
.
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ITC : international test conference : integration of test with design and manufacturing, Washignton, Sept. 1-3, 1987
by
Institute of Electrical and Electronics Engineers
|
.
Series:
Edition:
Language:
English
Publication details:
New York
;
IEEE,
;
1987
Availability:
Items available for loan:
1
Call number:
621.372:621.382 Ins:87
.
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ITC : international test conference : testings impact on design and technology : proceedings, Philadelphia, Sept. 8-11, 1986
by
Institute of Electrical and Electronics Engineers
|
.
Series:
Edition:
Language:
English
Publication details:
New York
;
IEEE,
;
1986
Availability:
Items available for loan:
1
Call number:
621.372:621.382 Ins:86
.
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ITC : international test conference : new frontiers in testing : proceedings, Washington, DC, Sept. 12-14, 1988
by
Institute of Electrical and Electronics Engineers
|
.
Series:
Edition:
Language:
English
Publication details:
Washington, D.C.
;
IEEE Computer Soc. Press,
;
1988
Availability:
Items available for loan:
1
Call number:
621.372:621.382 Ins:88
.
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ITC : international test conference : three faces of test : design,characterrization, production : proceedings, Philadelphia, Oct. 16-18, 1984
by
Institute of Electrical and Electronics Engineers
|
.
Series:
Edition:
Language:
English
Publication details:
New York
;
IEEE,
;
1984
Availability:
Items available for loan:
1
Call number:
621.372:621.382 Ins:84
.
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ITC : international test conference : proceedings, 20th, Washington, DC, Aug. 29-31, 1989
by
Institute of Electrical and Electronics Engineers
|
.
Series:
Edition:
Language:
English
Publication details:
Washington
;
IEEE Computer Society Press,
;
1989
Availability:
Items available for loan:
1
Call number:
621.372:621.382 Ins:20:89
.
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