International test conference : testing in the 1980s : digest of papers, Philadelphia, Oct. 27-29, 1981

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: New York ; IEEE, ; 1981Edition: Description: xxiv,568 p; 27cmISBN: 1Subject(s): | Electronic-Testing-Congresses
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
Compact Storage - Basement Area 		621.372:621.382 Ins:81 Available C13B21 115963
Total holds: 0

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