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ITC : international test conference : new frontiers in testing : proceedings, Washington, DC, Sept. 12-14, 1988

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: Washington, D.C. ; IEEE Computer Soc. Press, ; 1988Edition: Description: xxx,1005 p; 27cmISBN: 0-8186-0870-60Subject(s): | Electronic-Testing-Congresses

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode	Item holds
Books	Central Library, IITB Compact Storage - Basement Area	621.372:621.382 Ins:88	Available	C13B22		149708

Total holds: 0

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