Test conference : testing for the 80s : digest of papers, conference, 11th, Philadelphia, Nov. 11-13, 1980

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: New York ; IEEE, ; 1980Edition: Description: xv,507p; 28 cmISBN: 0Subject(s): | Electronic-Testing-Congresses
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
Compact Storage - Basement Area 		621.372:621.382 Ins:80 Available C13B22 110358
Total holds: 0

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