International test conference : quality productivity profit : digest of papers, Philadelphia, Nov. 15-18, 1982

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: New York ; IEEE, ; 1982Edition: Description: xxiii, 672 p; 28 cmISBN: 1Subject(s): | Electronic-Testing-Congresses
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
Compact Storage - Basement Area 		621.372:621.382 Ins:82 Available C13B21 122385
Total holds: 0

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