ITC : international test conference : testings impact on design and technology : proceedings, Philadelphia, Sept. 8-11, 1986
Language: English Series: Publication details: New York ; IEEE, ; 1986Edition: Description: xxx,1009 p; 27cmISBN: 0-8186-0726-21Subject(s): | Electronic-Testing-CongressesItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB Compact Storage - Basement Area | 621.372:621.382 Ins:86 | Available | C13B22 | 145034 |
Total holds: 0
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