ITC : international test conference : three faces of test : design,characterrization, production : proceedings, Philadelphia, Oct. 16-18, 1984

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: New York ; IEEE, ; 1984Edition: Description: xxxi,886 p; 28 cmISBN: 0-8186-0548-00Subject(s): | Electronic-Testing-Congresses
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
Compact Storage - Basement Area 		621.372:621.382 Ins:84 Available C13B22 129287
Total holds: 0

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