ITC : international test conference : proceedings, 20th, Washington, DC, Aug. 29-31, 1989

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: Washington ; IEEE Computer Society Press, ; 1989Edition: Description: xxxiv,959 p; 27cmISBN: 0-8186-8962-51Subject(s): | Electronic-testing-Congresses
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
Compact Storage - Basement Area 		621.372:621.382 Ins:20:89 Available G35B37 156359
Total holds: 0

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