ITC : international test conference : integration of test with design and manufacturing, Washignton, Sept. 1-3, 1987

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: New York ; IEEE, ; 1987Edition: Description: xxxi,1151 p; 28 cmISBN: 0-8186-0798-X2Subject(s): | Electronic-Testing-Congresses
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
Compact Storage - Basement Area 		621.372:621.382 Ins:87 Available G35B38 144972
Total holds: 0

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