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		No cover image available Test conference : testing for the 80s : digest of papers, conference, 11th, Philadelphia, Nov. 11-13, 1980 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: New York ; IEEE, ; 1980Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:80. Place hold Add to cart (remove)
		No cover image available International test conference : testing in the 1980s : digest of papers, Philadelphia, Oct. 27-29, 1981 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: New York ; IEEE, ; 1981Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:81. Place hold Add to cart (remove)
		No cover image available International test conference : quality productivity profit : digest of papers, Philadelphia, Nov. 15-18, 1982 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: New York ; IEEE, ; 1982Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:82. Place hold Add to cart (remove)
		No cover image available ITC : international test conference : integration of test with design and manufacturing, Washignton, Sept. 1-3, 1987 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: New York ; IEEE, ; 1987Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:87. Place hold Add to cart (remove)
		No cover image available ITC : international test conference : testings impact on design and technology : proceedings, Philadelphia, Sept. 8-11, 1986 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: New York ; IEEE, ; 1986Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:86. Place hold Add to cart (remove)
		No cover image available ITC : international test conference : new frontiers in testing : proceedings, Washington, DC, Sept. 12-14, 1988 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: Washington, D.C. ; IEEE Computer Soc. Press, ; 1988Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:88. Place hold Add to cart (remove)
		No cover image available Electronic test equipment : theory and applications by Byers, T.J \| . Series: Edition: Language: English Publication details: New York ; Intertext Pub./McGraw-Hill Book, ; 1987Availability: Items available for loan: 1 Call number: 621.317.2 Bye. Place hold Add to cart (remove)
		No cover image available ITC : international test conference : three faces of test : design,characterrization, production : proceedings, Philadelphia, Oct. 16-18, 1984 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: New York ; IEEE, ; 1984Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:84. Place hold Add to cart (remove)
		No cover image available ITC : international test conference : proceedings, 20th, Washington, DC, Aug. 29-31, 1989 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: Washington ; IEEE Computer Society Press, ; 1989Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:20:89. Place hold Add to cart (remove)
		No cover image available Electronic component testing / edited by W.F. Waller by \| . Series: Edition: Language: English Publication details: London ; Macmillan, ; 1971Availability: Items available for loan: 1 Call number: 621.317.2 Ele. Place hold Add to cart (remove)

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