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Traps and trap generation in ultrathin jet vapor deposited, JVD, silicon nitride gate dielectrics (R)

by ManjulaRani, K.N [Author] | Vasi, J.M [Supervisor] | Ramgopal Rao, V [Supervisor] | Indian Institute of Technology Bombay Department of Electrical Engineering.

Language: English Publication details: Bombay IIT 2004Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2004 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3:621.315.61 Man.

Optimization of deep sub-micron CMOS technologies for mixed signal circuits (R)

by Narasimhulu, K [Author] | Rao Ramgopal, V [Supervisor] | Indian Institute of Technology Bombay Department of Electrical Engineering.

Language: English Publication details: Bombay IIT 2006Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2006 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3 Nar.

Negative bias temperature instability for SiON p-MOSFETs (R)

by Maheta, Vrajesh D [Author] | Mahapatra, S [Supervisor] | Indian Institute of Technology Bombay Department of Electrical Engineering.

Language: English Publication details: Bombay ; IIT ; 2008Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2008 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Mah.

Technology-circuit co-design using Finfets at sub-22 NM nodes (R)

by Sachid, Angada B [Author] | Rao, V. Ramgopal [Supervisor] | Baghini, Maryam Shojaei [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Language: English Publication details: Mumbai IIT 2010Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2010 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3 Sac.

Characterization and modeling of negative bias temperature instability in silicon oxynitride(SiON) and high-K/MG P-MOSFETs (R)

by Deora, Shweta [Author] | Kottantharayil, Anil [Supervisor] | Indian Institute of Technology Bomba Department of Electrical Engineering.

Language: English Publication details: Mumbai IIT 2012Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2012 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Deo.

Investigation of junction-less transistor (JLT) for CMOS scaling (R)

by Gundapaneni, Suresh [Author] | Kottantharayil, Anil [Supervisor] | Ganguly, Swaroop [Supervisor].

Language: English Publication details: Mumbai IIT 2012Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2012 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3 Gun.

CMOS reliability in advanced technology nodes : device to circuit interaction (R)

by Mishra, Subrat [Author] | Mahapatra, Souvik [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Material type: Text Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Mis.

Transition metal dichalcogenides for logic and memory applications (R)

by Kaushik, Naveen [Author] | Lodha, Saurabh [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Material type: Text Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3 Kau.

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