Negative bias temperature instability for SiON p-MOSFETs (R)
Language: English Publication details: Bombay ; IIT ; 2008Description: xv,90 p; 30 cmSubject(s): Mahapatra, S | Theses and Dissertations | Silicon nitride | Metal oxide semiconductors field-effect transistors | Metal oxide semiconductors-Effect of temperature onDissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2008Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Theses and Dissertations | Central Library, IITB Pamphlet Section (Theses, Standards, Reports) | 043:621.382 Mah | Not for loan | D08A27 | 220599 |
Total holds: 0
Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2008
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