Negative bias temperature instability for SiON p-MOSFETs (R)

By: Maheta, Vrajesh D [Author]Contributor(s): Mahapatra, S [Supervisor] | Indian Institute of Technology Bombay Department of Electrical EngineeringLanguage: English Publication details: Bombay ; IIT ; 2008Description: xv,90 p; 30 cmSubject(s): Mahapatra, S | Theses and Dissertations | Silicon nitride | Metal oxide semiconductors field-effect transistors | Metal oxide semiconductors-Effect of temperature onDissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2008
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
Pamphlet Section (Theses, Standards, Reports) 		043:621.382 Mah Not for loan D08A27 220599
Total holds: 0

Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2008

There are no comments on this title.

to post a comment.
Share

Powered by Koha