CMOS reliability in advanced technology nodes : device to circuit interaction (R)
Material type:
TextLanguage: English Publication details: Mumbai IIT 2018Description: xix,155 p. 30 cmSubject(s): Theses and Dissertations | Metal oxide semiconductors, Complementary | Transistor circuits | Metal oxide semiconductors field-effect transistorsDissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018
| Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|
Theses and Dissertations
|
Central Library, IITB Pamphlet Section (Theses, Standards, Reports) | 043:621.382 Mis | Not for loan | 242557 |
Total holds: 0
Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018
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