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		No cover image available Electron traps in thermally nitrided silicon dioxide (R) by Ramesh, Karmungi [Author] \| Vasi, J [Supervisor] \| Chandorkar, A [Supervisor] \| Indian Institute of Technology Bombay. Department of Electrical Engineering. Language: English Publication details: Bombay IIT 1989Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 1989 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382:539.124 Ram. Add to cart (remove)
		No cover image available Traps and trap generation in ultrathin jet vapor deposited, JVD, silicon nitride gate dielectrics (R) by ManjulaRani, K.N [Author] \| Vasi, J.M [Supervisor] \| Ramgopal Rao, V [Supervisor] \| Indian Institute of Technology Bombay Department of Electrical Engineering. Language: English Publication details: Bombay IIT 2004Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2004 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3:621.315.61 Man. Add to cart (remove)
		No cover image available Reliability studies in SONOS flash EEPROMs (R) by Bharath Kumar P [Author] \| Mahapatra, S [Supervisor] \| Indian Institute of Technology Bombay Department of Electrical Engineering. Language: English Publication details: Bombay IIT 2006Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2006 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382:669.782 Bha. Add to cart (remove)
		No cover image available Negative bias temperature instability for SiON p-MOSFETs (R) by Maheta, Vrajesh D [Author] \| Mahapatra, S [Supervisor] \| Indian Institute of Technology Bombay Department of Electrical Engineering. Language: English Publication details: Bombay ; IIT ; 2008Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2008 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Mah. Add to cart (remove)
		No cover image available Characterization and modeling of negative bias temperature instability in silicon oxynitride(SiON) and high-K/MG P-MOSFETs (R) by Deora, Shweta [Author] \| Kottantharayil, Anil [Supervisor] \| Indian Institute of Technology Bomba Department of Electrical Engineering. Language: English Publication details: Mumbai IIT 2012Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2012 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Deo. Add to cart (remove)
		No cover image available Characterization and modelling of NBTI in silicon oxynitride (SiON) and high-k metal gate p-MOSFETs with impact on circuit performance (R) by Goel, Nilesh [Author] \| Mahapatra, Souvik [Supervisor] \| Indian Institute of Technology Bombay. Department of Electrical Engineering. Language: English Publication details: Mumbai IIT 2015Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2015 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Goe. Add to cart (remove)
		No cover image available Ultra thin silicon nitride by hot-wire chemical vapour deposition for photovoltaic applications (R) by Rai, Dharmendra Kumar Rajdeo \| Solanki, Chetan Singh [Supervisor] \| Kavaipatti, Balasubramaniam [Supervisor] \| Indian Institute of Technology Bombay. Department of Energy Science and Engineering. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Energy Science and Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:620.91:621.793 Rai. Add to cart (remove)

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