Reliability studies in SONOS flash EEPROMs (R)
Language: English Publication details: Bombay IIT 2006Description: xv,120 p; 30 cmSubject(s): Mahapatra, S | Theses and Dissertations | Semiconductor storage devices-Reliability | Silicon nitrideDissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2006Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Theses and Dissertations | Central Library, IITB Pamphlet Section (Theses, Standards, Reports) | 043:621.382:669.782 Bha | Not for loan | D08A26 | 212338 |
Total holds: 0
Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2006
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