Your search returned 7 results.

Sort
Results
Scaling and optimization of CMOS technologies for logic and non-volatile memory applications (R) by
Language: English
Publication details: Bombay IIT 2003
Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2003
Availability: Items available for reference: Central Library, IITB: Not for loan (1)Call number: 043:621.372:621.382 Moh.

Optimization of deep sub-micron CMOS technologies for mixed signal circuits (R) by
Language: English
Publication details: Bombay IIT 2006
Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2006
Availability: Items available for reference: Central Library, IITB: Not for loan (1)Call number: 043:621.382.3 Nar.

Evaluation of DTMOS as a solution to the voltage scaling problem : a circuit performance perspective (R) by
Language: English
Publication details: Bombay IIT 2006
Dissertation note: Thesis Ph.D Indian Institute of Technology Bombay. Department of Electrical Engineering 2006
Availability: Items available for reference: Central Library, IITB: Not for loan (1)Call number: 043:621.382 Bul.

I/O and ESD device optimization for nanometer node CMOS technologies (R) by
Language: English
Publication details: Mumbai IIT 2010
Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2010
Availability: Items available for reference: Central Library, IITB: Not for loan (1)Call number: 043:621.382:621.372 Shr.

Design and analysis of energy-efficient signaling schemes for long on-chip wires (R) by
Language: English
Publication details: Mumbai IIT 2013
Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2013
Availability: Items available for reference: Central Library, IITB: Not for loan (1)Call number: 043:621.382:621.391.8 Dav.

CMOS device design and circuit performance of silicon gate all around nanowire MOSFETs in scaled technologies (R) by
Language: English
Publication details: Mumbai 2014 IIT
Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2014
Availability: Items available for reference: Central Library, IITB: Not for loan (1)Call number: 043:621.382.3 Nay.

Testability issues in nanometer technologies : a new test methodology and worst-case -path delay estimation technique (R) by
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Mumbai IIT 2018
Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018
Availability: Items available for reference: Central Library, IITB: Not for loan (1)Call number: 043:621.382:621.372 Sri.