Testability issues in nanometer technologies : a new test methodology and worst-case -path delay estimation technique (R)

By: Srivastava, Ankush [Author]Contributor(s): Singh, Virendra [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical EngineeringMaterial type: TextTextLanguage: English Publication details: Mumbai IIT 2018Description: xviii,168 p. 30 cmSubject(s): Theses and Dissertations | Metal oxide semiconductors | Complimentary | Electric dischargesDissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018
List(s) this item appears in: Display List 07/01/2019-13/01/2019
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
Pamphlet Section (Theses, Standards, Reports) 		043:621.382:621.372 Sri Not for loan D03A24 243337
Total holds: 0

Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018

2018

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