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Studies in testing of transistor stuck-open faults in combinational CMOS circuits (R)

By: Sherlekar S.D [Author]Contributor(s): Vasi, J [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering Language: English Publication details: Bombay IIT 1987Description: xi, 135 p. 27 cmISBN: 0Subject(s): Theses and Dissertations | VLSI circuits | TestingDissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 1987

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Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode	Item holds
Theses and Dissertations	Central Library, IITB Pamphlet Section (Theses, Standards, Reports)	043:621.372:621.382 She	Not for loan	D08A22		148531

Total holds: 0

Thesis
Ph.D.
Indian Institute of Technology Bombay. Department of Electrical Engineering 1987

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