Studies in testing of transistor stuck-open faults in combinational CMOS circuits (R) (Record no. 166670)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00885 a2200265 4500 |
| 001 - CONTROL NUMBER | |
| control field | 44074 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20230429133732.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230429b |||||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 0 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IITB |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER | |
| Universal Decimal Classification number | 043:621.372:621.382 |
| Item number | She |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Sherlekar S.D. |
| Relator term | Author |
| 9 (RLIN) | 46421 |
| 245 ## - TITLE STATEMENT | |
| Title | Studies in testing of transistor stuck-open faults in combinational CMOS circuits (R) |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Bombay |
| Name of publisher, distributor, etc. | IIT |
| Date of publication, distribution, etc. | 1987 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xi, 135 p. |
| Dimensions | 27 cm |
| 502 ## - DISSERTATION NOTE | |
| Dissertation note | Thesis<br/> |
| Degree type | Ph.D.<br/> |
| Name of granting institution | Indian Institute of Technology Bombay. Department of Electrical Engineering |
| Year degree granted | 1987 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Theses and Dissertations |
| 9 (RLIN) | 21 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | VLSI circuits |
| 9 (RLIN) | 9748 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Testing |
| 9 (RLIN) | 47343 |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Vasi, J. |
| Relator term | Supervisor |
| 9 (RLIN) | 47339 |
| 710 ## - ADDED ENTRY--CORPORATE NAME | |
| 9 (RLIN) | 64 |
| Corporate name or jurisdiction name as entry element | Indian Institute of Technology Bombay. |
| Subordinate unit | Department of Electrical Engineering |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Theses and Dissertations |
| Source of classification or shelving scheme | |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Cost, normal purchase price | Full call number | Barcode | Date last seen | Cost, replacement price | Price effective from | Koha item type | Public note | Shelf |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Central Library, IITB | Central Library, IITB | Pamphlet Section (Theses, Standards, Reports) | 01/02/2018 | 0.00 | 043:621.372:621.382 She | 148531 | 01/02/2018 | 0.00 | 01/02/2018 | Theses and Dissertations | D08A22 | D08A22 |