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Studies in testing of transistor stuck-open faults in combinational CMOS circuits (R)

Sherlekar S.D.

Studies in testing of transistor stuck-open faults in combinational CMOS circuits (R) - Bombay IIT 1987 - xi, 135 p. 27 cm

Thesis

ISBN: 0

Subjects--Topical Terms:
Theses and Dissertations
VLSI circuits
Testing

Universal Decimal Class. No.: 043:621.372:621.382 / She

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