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Studies in testing of transistor stuck-open faults in combinational CMOS circuits (R)

by Sherlekar S.D [Author] | Vasi, J [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Language: English Publication details: Bombay IIT 1987Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 1987 Availability: Items available for reference: Not for loan (1) Call number: 043:621.372:621.382 She.

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Digital design from the VLSI perspective : concepts for VLSI beginners

by Taraate, Vaibbhav [Author].

Language: English Publication details: Singapore Springer Nature 2023Availability: Items available for loan: 1 Call number: 621.372:621.382 Tar.
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