Microelectronics Test Patterns : An Overview

Contributor(s): Language: English Series: NBS SMT SP - 400 - 6 : 1975Publication details: Washington, D.C. ; NBS ; 1974Edition: Description: 24 p; ISBN: Subject(s): | Integrated circuits, Microelectronic test patternsOnline resources: Click here to access online
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNBS SMT SP - 400 - 6 : 1975 Not for loan A41077
Total holds: 0

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