Microelectronics Test Patterns : An Overview (Record no. 253658)

MARC details
000 -LEADER
fixed length control field 00522 a2200241 4500
001 - CONTROL NUMBER
control field 305103
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title eng
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER
Universal Decimal Classification number LNBS SMT SP - 400 - 6 : 1975
245 ## - TITLE STATEMENT
Title Microelectronics Test Patterns : An Overview
250 ## - EDITION STATEMENT
Edition statement
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Washington, D.C.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. NBS
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Date of publication, distribution, etc. 1974
300 ## - PHYSICAL DESCRIPTION
Extent 24 p.
300 ## - PHYSICAL DESCRIPTION
Dimensions
490 ## - SERIES STATEMENT
Series statement NBS SMT SP - 400 - 6 : 1975
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits, Microelectronic test patterns
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier NBS
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Pamphlets Standards Reports
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Cost, normal purchase price Total Checkouts Full call number Barcode Date last seen Cost, replacement price Price effective from Koha item type
          Central Library, IITB Central Library, IITB 02/02/2018 0.00   LNBS SMT SP - 400 - 6 : 1975 A41077 02/02/2018 0.00 02/02/2018 Pamphlets Standards Reports

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