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Microelectronics Test Patterns : An Overview

Microelectronics Test Patterns : An Overview - - Washington, D.C. NBS 1974 - 24 p. - NBS SMT SP - 400 - 6 : 1975 .

ISBN:

Subjects--Topical Terms:

Integrated circuits, Microelectronic test patterns

Universal Decimal Class. No.: LNBS SMT SP - 400 - 6 : 1975

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