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		DSP-based testing of analog and mixed-signal circuits : tutorial by Mahoney, Matthew \| . Series: Edition: Language: English Publication details: New York ; IEEE Computer Soc. Press ; 1987Availability: Items available for loan: 1 Call number: 621.317.2:621.391.8Mah. Place hold Add to cart (remove)
		No cover image available Integrating design and test : using cae tools for ATE programming by Parker, Kenneth P \| . Series: Edition: Language: English Publication details: Washington, D.C. ; : Computer Society Press of the I ; Availability: Items available for loan: 1 Call number: 621.317.2:681.3 Par. Place hold Add to cart (remove)
		No cover image available Automatic test program generation workshop proceedings, 3rd, San Francisco, California, Mar. 15-16, 1983 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: New York ; IEEE, ; 1983Availability: Items available for loan: 1 Call number: 621.317.3:621-52 Ins:3: 83. Place hold Add to cart (remove)
		No cover image available Electrical testing for practical engineers by Stubbings, G.W \| . Series: Edition: 2nd ed Language: English Publication details: London ; E. and F. N. Spon, ; 1939Availability: Items available for loan: 1 Call number: 621.317.2 Stu. Place hold Add to cart (remove)
		No cover image available Electrical testing for practical engineers by Stubbings, G.W \| . Series: Edition: 2nd ed Language: English Publication details: London ; E. and F. N. Spon, ; 1947Availability: Items available for loan: 1 Call number: 621.317.2 Stu(2). Place hold Add to cart (remove)
		No cover image available Electronic tests and measurements by Middleton, Robert G \| . Series: Edition: Language: English Publication details: Indianapolis ; Howard W.Sams/Bobbs-Merrill, ; 1963Availability: Items available for loan: 1 Call number: 621.317.3 Mid. Place hold Add to cart (remove)
		No cover image available ICMTS 90 : proceedings of the international conference on microelectronic test structures, San Diego, California, Mar. 5-7, 1990 by Institute of Electrical and Electronics Engineers \| . Series: Edition: Language: English Publication details: New York ; IEEE, ; 1990Availability: Items available for loan: 1 Call number: 621.372:621.382 Ins:90. Place hold Add to cart (remove)
		No cover image available ABC s of electronic test equipment by Smith, D.A \| . Series: Edition: 2nd ed Language: English Publication details: Bombay ; Taraporevala , ; 1968Availability: Items available for loan: 1 Call number: 621.317.2 Smi. Place hold Add to cart (remove)

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