Automatic test program generation workshop proceedings, 3rd, San Francisco, California, Mar. 15-16, 1983

By: Institute of Electrical and Electronics EngineersContributor(s): Language: English Series: Publication details: New York ; IEEE, ; 1983Edition: Description: ix,133 p; 27 cmISBN: 0-8186-8461-50Subject(s): | Electric testing
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Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
Compact Storage - Basement Area 		621.317.3:621-52 Ins:3: 83 Available C13B07 123415
Total holds: 0

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