ICMTS 90 : proceedings of the international conference on microelectronic test structures, San Diego, California, Mar. 5-7, 1990
Language: English Series: Publication details: New York ; IEEE, ; 1990Edition: Description: x,244 p; 28 cmISBN: 11Subject(s): | Electric testing | Microelectronics-Testing-Congresses| Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Books
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Central Library, IITB Compact Storage - Basement Area | 621.372:621.382 Ins:90 | Available | G35B37 | 157824 |
Total holds: 0
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