Thin film and depth profile analysis

Contributor(s): Oechsner, H [Editor]Language: English Series: Topics in current physics ; 37Publication details: Berlin Springer-Verlag 1984Description: xi,205 p. 25 cmISBN: 978-3-642-46501-7Subject(s): Physics | Thin films -- Surfaces | Surface chemistry | Sputtering(Physics)
List(s) this item appears in: Display List 04/02/2019-10/02/2019
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Item type Current library Call number Status Date due Barcode Item holds
Books Books Central Library, IITB
General Stacks 		539.23 Thi(2) Available 243405
Total holds: 0

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