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		No cover image available Characterization and modelling of NBTI in silicon oxynitride (SiON) and high-k metal gate p-MOSFETs with impact on circuit performance (R) by Goel, Nilesh [Author] \| Mahapatra, Souvik [Supervisor] \| Indian Institute of Technology Bombay. Department of Electrical Engineering. Language: English Publication details: Mumbai IIT 2015Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2015 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Goe. Add to cart (remove)
		No cover image available CMOS reliability in advanced technology nodes : device to circuit interaction (R) by Mishra, Subrat [Author] \| Mahapatra, Souvik [Supervisor] \| Indian Institute of Technology Bombay. Department of Electrical Engineering. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Mis. Add to cart (remove)
		No cover image available Physics, characterization, and modeling of negative bias temperature instability in advanced nanoscale transistors (R) by Parihar, Narendra [Author] \| Mahapatra, Souvik [Supervisor] \| Indian Institute of Technology Bombay. Department of Electrical Engineering. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3 Par. Lists: Display List 08/04/2019-14/04/2019. Add to cart (remove)

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