Security and testability issues in modern VLSI chips (R)
Material type: TextLanguage: English Publication details: Mumbai IIT 2018Description: xvi,226 p. 30 cmSubject(s): Theses and Dissertations | Digital integrated circuits -- Design and construction -- Data processing | Integrated circuits -- Very largescale integration -- Testing | Integrated circuits -- Very largescale integration -- Security measuresDissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018Item type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
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Theses and Dissertations | Central Library, IITB Pamphlet Section (Theses, Standards, Reports) | 043:621.372:621.382 Ahl | Not for loan | D03A23 | 245315 |
Total holds: 0
Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018
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