Security and testability issues in modern VLSI chips (R) (Record no. 275982)
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000 -LEADER | |
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fixed length control field | 01019nam a22002537a 4500 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | OSt |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20230603115541.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 190717b xxu||||| |||| 00| 0 eng d |
040 ## - CATALOGING SOURCE | |
Transcribing agency | IITB |
041 ## - LANGUAGE CODE | |
Language code of text/sound track or separate title | eng |
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER | |
Universal Decimal Classification number | 043:621.372:621.382 |
Item number | Ahl |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Ahlawat, Satyadev |
9 (RLIN) | 9727 |
Relator term | Author |
245 ## - TITLE STATEMENT | |
Title | Security and testability issues in modern VLSI chips (R) |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | Mumbai |
Name of publisher, distributor, etc. | IIT |
Date of publication, distribution, etc. | 2018 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xvi,226 p. |
Dimensions | 30 cm |
502 ## - DISSERTATION NOTE | |
Dissertation note | Thesis |
Degree type | Ph.D. |
Name of granting institution | Indian Institute of Technology Bombay. Department of Electrical Engineering |
Year degree granted | 2018 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Theses and Dissertations |
9 (RLIN) | 21 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Digital integrated circuits |
General subdivision | Design and construction |
-- | Data processing |
9 (RLIN) | 9749 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Integrated circuits |
General subdivision | Very largescale integration |
-- | Testing |
9 (RLIN) | 9750 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Integrated circuits |
General subdivision | Very largescale integration |
-- | Security measures |
9 (RLIN) | 9751 |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Singh, Virendra |
Relator term | Supervisor |
9 (RLIN) | 2135 |
710 ## - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | Indian Institute of Technology Bombay. |
Subordinate unit | Department of Electrical Engineering |
9 (RLIN) | 64 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Source of classification or shelving scheme | |
Koha item type | Theses and Dissertations |
Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type | Public note |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Central Library, IITB | Central Library, IITB | Pamphlet Section (Theses, Standards, Reports) | 17/07/2019 | 043:621.372:621.382 Ahl | 245315 | 17/07/2019 | 17/07/2019 | Theses and Dissertations | D03A23 |