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Detailed study of gate insulator process impact on NBTI and PBTI degradation in HKMG stacks (R)

by Joshi, Kaustubh [Author] | Mahapatra, Souvik [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Language: English Publication details: Mumbai IIT 2014Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2014 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Jos.

Characterization and modelling of NBTI in silicon oxynitride (SiON) and high-k metal gate p-MOSFETs with impact on circuit performance (R)

by Goel, Nilesh [Author] | Mahapatra, Souvik [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Language: English Publication details: Mumbai IIT 2015Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2015 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Goe.

CMOS reliability in advanced technology nodes : device to circuit interaction (R)

by Mishra, Subrat [Author] | Mahapatra, Souvik [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Material type: Text Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382 Mis.

Physics, characterization, and modeling of negative bias temperature instability in advanced nanoscale transistors (R)

by Parihar, Narendra [Author] | Mahapatra, Souvik [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Material type: Text Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2018Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2018 Availability: Items available for reference: Not for loan (1) Call number: 043:621.382.3 Par.

β-Ga2O3 and Ge transistors for future high performance electronics (R)

by Joishi, Chandan [Author] | Lodha, Saurabh [Supervisor] | Mahapatra, Souvik [Supervisor] | Indian Institute of Technology Bombay. Department of Electrical Engineering.

Material type: Text Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai IIT 2020Dissertation note: Thesis Ph.D. Indian Institute of Technology Bombay. Department of Electrical Engineering 2020 Availability: Items available for reference: Not for loan (1) Call number: 621.382.3 Joi.

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