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		No cover image available Thermodynamic properties of helium from 3 to 300 k between 0.5 and 100 atmospheres (R) by Mann, Douglas B \| . Series: Edition: Language: English Publication details: Washington ; National Bureau of Standards ; 1962Availability: Items available for loan: 1 Call number: 546.291:536.48(083)Man. Place hold Add to cart (remove)
		No cover image available Precision measurement and calibration : selected NBS papers on temperature (R) by United States. Department of Commerce \| . Series: Edition: Language: English Publication details: Washington ; National Bureau of Standards, ; 1968Availability: Items available for loan: 1 Call number: 681(083.7) Uni-2. Place hold Add to cart (remove)
		No cover image available Thermophysical properties of helium-4 from 2 to 1500 k with pressure to 1000 atmosphers (R) by McCarty, R.D \| . Series: Edition: Language: English Publication details: Washington ; National Bureau of Standards ; 1972Availability: Items available for loan: 1 Call number: 546.291:536.45(083)McC. Place hold Add to cart (remove)
		No cover image available Electron physics tables (R) by United States. Deparment of Commerce \| . Series: Edition: Language: English Publication details: Washington ; National Bureau of Standards ; 1956Availability: Items available for loan: 1 Call number: 621.38(083)U.S.D.C.. Place hold Add to cart (remove)
		No cover image available Refrigeration for cryogenic sensors and electronic systems : Proceedings of a conference held at the National Bureau of Standards, Boulder by . Series: NBS SP 607 : 1981Edition: Language: English Publication details: Washington, D.C. ; National Bureau of standards ; 1981Online access: Click here to access online Availability: Items available for reference: Not for loan (1) Call number: LNBS SP 607 : 1981. Add to cart (remove)
		No cover image available Semiconductor masurement technology : The dopant density and temperature dependence of electron mobility and resistivity in N-type silicon by . Series: NBS SMT SP - 400 - 33 : 1977Edition: Language: English Publication details: Washington, D.C. ; National Bureau of standards ; 1977Online access: Click here to access online Availability: Items available for reference: Not for loan (1) Call number: LNBS SMT SP - 400 - 33 : 1977. Add to cart (remove)
		No cover image available Safe operation of capacitance meters using high applied-bias voltage by . Series: NBS SMT SP - 400 - 34 : 1976Edition: Language: English Publication details: Washington, D.C. ; National Bureau of standards ; 1976Online access: Click here to access online Availability: Items available for reference: Not for loan (1) Call number: LNBS SMT SP - 400 - 34 : 1976. Add to cart (remove)
		No cover image available Laser scanning of active semiconductor devices by . Series: NBS SMT SP - 400 - 27 : 1974Edition: Language: English Publication details: Illinois ; National Bureau of standards ; 1976Online access: Click here to access online Availability: Items available for reference: Not for loan (1) Call number: LNBS SMT SP - 400 - 27 : 1974. Add to cart (remove)
		No cover image available Microelectronics test pattern NBS-3 for evaluting the resistivity- dopant density relationship of silicon by . Series: NBS SMT SP - 400 - 22 : 1976Edition: Language: English Publication details: Washington, D.C. ; National Bureau of standards ; 1976Online access: Click here to access online Availability: Items available for reference: Not for loan (1) Call number: LNBS SMT SP - 400 - 22 : 1976. Add to cart (remove)

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