Laser scanning of active semiconductor devices

Contributor(s): Language: English Series: NBS SMT SP - 400 - 27 : 1974Publication details: Illinois ; National Bureau of standards ; 1976Edition: Description: 26 p; ISBN: Subject(s): | Failure analysis, Hot spots, Integrated circuits, Reliability, TransistorsOnline resources: Click here to access online
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNBS SMT SP - 400 - 27 : 1974 Not for loan A41089
Total holds: 0

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