Thin film and depth profile analysis
Language: English Series: Topics in current physics ; 37Publication details: Berlin Springer-Verlag 1984Description: xi,205 p. 25 cmISBN: 978-3-642-46501-7Subject(s): Physics | Thin films -- Surfaces | Surface chemistry | Sputtering(Physics)Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books | Central Library, IITB General Stacks | 539.23 Thi(2) | Available | 243405 |
Total holds: 0
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