Characterization and modelling of NBTI in silicon oxynitride (SiON) and high-k metal gate p-MOSFETs with impact on circuit performance (R) (Record no. 236803)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 01086 a2200277 4500 |
| 001 - CONTROL NUMBER | |
| control field | 377816 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20240618133136.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230513b |||||||| |||| 00| 0 eng d |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IITB |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER | |
| Universal Decimal Classification number | 043:621.382 |
| Item number | Goe |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Goel, Nilesh |
| Relator term | Author |
| 9 (RLIN) | 43267 |
| 245 ## - TITLE STATEMENT | |
| Title | Characterization and modelling of NBTI in silicon oxynitride (SiON) and high-k metal gate p-MOSFETs with impact on circuit performance (R) |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Mumbai |
| Name of publisher, distributor, etc. | IIT |
| Date of publication, distribution, etc. | 2015 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xxv,208 p. |
| Dimensions | 30 cm |
| 502 ## - DISSERTATION NOTE | |
| Dissertation note | Thesis<br/> |
| Degree type | Ph.D.<br/> |
| Name of granting institution | Indian Institute of Technology Bombay. Department of Electrical Engineering |
| Year degree granted | 2015 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Theses and Dissertations |
| 9 (RLIN) | 21 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Silicon nitride |
| 9 (RLIN) | 387 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Metal oxide semiconductor field-effect transistors |
| 9 (RLIN) | 8903 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Metal oxide semiconductors-Effect of temperature on |
| 9 (RLIN) | 47304 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Gate array circuits |
| General subdivision | Materials |
| 9 (RLIN) | 9287 |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Mahapatra, Souvik |
| 9 (RLIN) | 450 |
| Relator term | Supervisor |
| 710 ## - ADDED ENTRY--CORPORATE NAME | |
| 9 (RLIN) | 64 |
| Corporate name or jurisdiction name as entry element | Indian Institute of Technology Bombay. |
| Subordinate unit | Department of Electrical Engineering |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Theses and Dissertations |
| Source of classification or shelving scheme | |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Cost, normal purchase price | Full call number | Barcode | Date last seen | Cost, replacement price | Price effective from | Koha item type | Public note | Shelf |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Central Library, IITB | Central Library, IITB | Pamphlet Section (Theses, Standards, Reports) | 02/02/2018 | 0.00 | 043:621.382 Goe | 239092 | 02/02/2018 | 0.00 | 02/02/2018 | Theses and Dissertations | D08B02 | D08B02 |