Anomalous x-ray scattering for materials characterization : atomic-scale structure determination

By: Waseda, YoshioContributor(s): Language: English Series: Springer tracts in modern physics ; v.179Publication details: Berlin ; Springer ; 2002Edition: Description: xiii,214 p; 23.5 cmISBN: 3-540-434430Subject(s): | Physics | X-rays-Scattering , Solid state physics
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
539.2:537.531.8Was Available G21B05 197269
Total holds: 0

There are no comments on this title.

to post a comment.
Share

Powered by Koha