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Anomalous x-ray scattering for materials characterization : atomic-scale structure determination

Waseda, Yoshio

Anomalous x-ray scattering for materials characterization : atomic-scale structure determination - - Berlin Springer 2002 - xiii,214 p. 23.5 cm - Springer tracts in modern physics ; v.179 .

ISBN: 3-540-434430

Subjects--Topical Terms:

Physics
X-rays-Scattering , Solid state physics

Universal Decimal Class. No.: 539.2:537.531.8Was

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