Degradation in Si and SiC MOS devices (R)

By: Ravishankar, RaContributor(s): Vasi, Juzer MLanguage: English Series: Publication details: Mumbai ; IIT ; 2001Edition: Description: viii,96 p; 30 cmISBN: Subject(s): Vasi, Juzer M | Theses and Dissertations | Metal oxide semiconductors , Silicon devices
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Theses and Dissertations Theses and Dissertations Central Library, IITB
043:621.382Rav Not for loan D03B12 193485
Total holds: 0

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