Normal view MARC view ISBD view

Degradation in Si and SiC MOS devices (R)

Ravishankar, Ra

Degradation in Si and SiC MOS devices (R) - - Mumbai IIT 2001 - viii,96 p. 30 cm - .

ISBN:

Subjects--Topical Terms:
Vasi, Juzer M.
Theses and Dissertations
Metal oxide semiconductors , Silicon devices

Universal Decimal Class. No.: 043:621.382Rav

Print
Add to your cart (remove)
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)