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		No cover image available Integrated circuit quality and reliability by Hnatek, Eugene R \| . Series: Edition: 2nd rev. ed Language: English Publication details: ; New York : Maracel Dekker, 1995 ; 1995Availability: Items available for loan: 1 Call number: 621.372:621.382 Hna. Place hold Add to cart (remove)
		No cover image available Failure analysis of integrated circuits : tools and techniques / edited by Lawrence C. Wagner by \| . Series: Edition: Language: English Publication details: Boston ; Kluwer Academic Pub., ; 1999Availability: Items available for loan: 1 Call number: 621.372:621.382 Fai. Place hold Add to cart (remove)
		Fault diagnosis of analog integrated circuits by Kabisatpathy, Prithviraj \| Barua, Alok \| Sinha, Satyabroto \| . Series: Edition: Language: English Publication details: A.A. Dordrecht ; Springer ; 2005Availability: Items available for loan: 1 Call number: 621.372:621.382Kab. Place hold Add to cart (remove)
		Failure-free integrated circuit packages : systematic elimination of failures through reliability engineering, failure analysis, and material improvements by \| Cohn, Charles \| Cohn, Charles. Series: Edition: Language: English Publication details: New York ; McGraw Hill ; 2005Availability: Items available for loan: 1 Call number: 621.372:621.382Fai. Place hold Add to cart (remove)
		No cover image available Study of MOS integrated circuit reliability in a space radiation environment (R) by Adak, Parimal Kumar \| Vasi, J. and Verma, A.K. Series: Edition: Language: English Publication details: Bombay ; IIT ; 1992Availability: Items available for reference: Not for loan (1) Call number: 043:621.372:621.382:538.56Ada. Add to cart (remove)
		No cover image available Improving memory reliability using a DRAM controller with ECC (R) by Srivatsa, R \| Chandorkar, A.N. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 2001Availability: Items available for reference: Not for loan (1) Call number: 043:621.372:658.562Sri. Add to cart (remove)
		No cover image available Wafer level defect density distribution for VLSI yield prediction (R) by Roy, Sujitkumar S \| Verma, A.K. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 2001Availability: Items available for reference: Not for loan (1) Call number: 043:621.372:621.382Roy. Add to cart (remove)
		Hybrid microcircuit reliability data (R) by . Series: Edition: Language: English Publication details: Oxford ; Pergamon Press ; 1976Availability: Items available for loan: 1 Call number: 621.372:621.382(083)Hyb. Place hold Add to cart (remove)
		No cover image available Fault simulation acceleration using an FPGA based hardware emulator (R) by Rawat, Harshita \| Desai, Madhav P. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 2007Availability: Items available for reference: Not for loan (2) Call number: 043:621.372:658.562Ala, ... Add to cart (remove)
		No cover image available Fault simulation acceleration using an FPGA based hardware emulator : performance modeling (R) by Goyal, Saurabh \| Desai, Madhav P. Series: Edition: Language: English Publication details: Mumbai ; IIT ; 2006Availability: Items available for reference: Not for loan (1) Call number: 043:621.372:658.562Goy. Add to cart (remove)

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