Normal view MARC view ISBD view

Integrated circuit quality and reliability

By: Hnatek, Eugene RContributor(s): Language: English Series: Publication details: ; New York : Maracel Dekker, 1995 ; 1995Edition: 2nd rev. edDescription: xiii,786 p; 24 cmISBN: 0-8247-9283-122Subject(s): | Integrated circuits-Reliability

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Status	Notes	Date due	Barcode	Item holds
Books	Central Library, IITB	621.372:621.382 Hna	Available	G35B35		174086

Total holds: 0

There are no comments on this title.

to post a comment.