Statistical approach to VLSI

By: Director, S.WContributor(s): Maly, W | Language: English Series: Publication details: ; Amsterdam : North-Holland, 1994 ; 1994Edition: Description: x,391p; 24 cmISBN: 0-444-88371-15Subject(s): | Integrated circuits - Very large scale integration defects | Integrated circuits - Very large scale integration - Designand construction - Statisticalmethods | Mathematical optimization
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Holdings
Item type Current library Call number Status Notes Date due Barcode Item holds
Books Books Central Library, IITB
621.372:621.382 Dir Available G35B30 170639
Total holds: 0

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