Statistical approach to VLSI

Director, S.W.

Statistical approach to VLSI - - Amsterdam : North-Holland, 1994 1994 - x,391p. 24 cm - .

0-444-88371-15



Integrated circuits - Very large scale integration defects
Integrated circuits - Very large scale integration - Designand construction - Statisticalmethods
Mathematical optimization

621.372:621.382 Dir

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