Microelectronics test pattern NBS-3 for evaluting the resistivity- dopant density relationship of silicon

Contributor(s): Language: English Series: NBS SMT SP - 400 - 22 : 1976Publication details: Washington, D.C. ; National Bureau of standards ; 1976Edition: Description: 49 p; ISBN: Subject(s): | Dopant density, Microelectronics, MOS capacitor, n-p-n transistor fabrication, p-n juncationOnline resources: Click here to access online
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNBS SMT SP - 400 - 22 : 1976 Not for loan A41085
Total holds: 0

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