ARPA/NBS workshop III : test patterns for integrated circuits

Contributor(s): Language: English Series: NBS SMT SP - 400 - 15 : 1976Publication details: Washington, D.C. ; National Bureau of standards ; 1976Edition: Description: 52 p; ISBN: Subject(s): | Data acquisition, Data display, Integrated circuits, Measurement technology, MicroelectronicsOnline resources: Click here to access online
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNBS SMT SP - 400 - 15 : 1976 Not for loan A41081
Total holds: 0

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