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ARPA/NBS workshop III : test patterns for integrated circuits

ARPA/NBS workshop III : test patterns for integrated circuits - - Washington, D.C. National Bureau of standards 1976 - 52 p. - NBS SMT SP - 400 - 15 : 1976 .

ISBN:

Subjects--Topical Terms:

Data acquisition, Data display, Integrated circuits, Measurement technology, Microelectronics

Universal Decimal Class. No.: LNBS SMT SP - 400 - 15 : 1976

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