ARPA / NBS workshop IV. surface analysis for silicon devices

Contributor(s): Language: English Series: NBS SMT SP - 400 - 23 : 1976Publication details: Washington, D.C. ; National Bureau of standards ; 1976Edition: Description: 238 p; ISBN: Subject(s): | Auger spectroscopy, Depth profiles, Electron beam induced imaging, ESCA, Insulator filmsOnline resources: Click here to access online
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Item type Current library Call number Status Date due Barcode Item holds
Pamphlets Standards Reports Pamphlets Standards Reports Central Library, IITB
LNBS SMT SP - 400 - 23 : 1976 Not for loan A41086
Total holds: 0

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