Anomalous x-ray scattering for materials characterization : atomic-scale structure determination
Language: English Series: Springer tracts in modern physics ; v.179Publication details: Berlin ; Springer ; 2002Edition: Description: xiii,214 p; 23.5 cmISBN: 3-540-434430Subject(s): | Physics | X-rays-Scattering , Solid state physicsItem type | Current library | Call number | Status | Notes | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | Central Library, IITB | 539.2:537.531.8Was | Available | G21B05 | 197269 |
Total holds: 0
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