Thin film reference materials development final redport for CRADA CN-1364
Language: English Series: NIST SP 400 - 100 : 1998Publication details: Gaithersburg ; National Institute of Standard and Technology ; 1998Edition: Description: 42 p; 28 cmISBN: Subject(s): | Calibration, Ellipsometry, Metrology, Reference materials, Silicon dioxideOnline resources: Click here to access onlineItem type | Current library | Call number | Status | Date due | Barcode | Item holds |
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Pamphlets Standards Reports | Central Library, IITB | LNIST SP 400 - 100 : 1998 | Not for loan | A64449 |
Total holds: 0
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